pcimage wrote:
What are the model and original f/w of your bad drives? (Maybe Doomer or someone else can confirm if they are indeed affected)
Seagate ST31000340AS
Part: 9BX158-303
Serial: 9QJ0TCCC
Old Firmware: SD15
Maxtor STM31000340AS
Part: 9GT158-325
Serial: 5QJ074FB
Old Firmware: MX15
New one: MX1A
pcimage wrote:
And you can categorically state that you have no power issue when two drives die simultaneously?
Yes I'm sure
pcimage wrote:
I was trying to help
And I thank you.
Below smarctl information from the Maxtor:
Code:
=== START OF INFORMATION SECTION ===
Device Model: MAXTOR STM31000340AS
Serial Number: 5QJ074FB
Firmware Version: MX1A
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sun Jul 12 12:01:06 2009 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 634) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 224) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103b) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 109 099 006 Pre-fail Always - 146094291
3 Spin_Up_Time 0x0003 093 091 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 099 099 020 Old_age Always - 1309
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 069 069 030 Pre-fail Always - 68885281470
9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 8249
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 1
12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1771
184 Unknown_Attribute 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 156
188 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 65537
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 074 067 045 Old_age Always - 26 (Lifetime Min/Max 19/26)
194 Temperature_Celsius 0x0022 026 040 000 Old_age Always - 26 (0 19 0 0)
195 Hardware_ECC_Recovered 0x001a 041 041 000 Old_age Always - 146094291
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 1
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 162 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 162 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 50 ff ff ff 4f 00 05:19:40.996 READ FPDMA QUEUED
60 00 c0 ff ff ff 4f 00 05:19:40.995 READ FPDMA QUEUED
60 00 40 ff ff ff 4f 00 05:19:40.995 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:40.995 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:40.995 READ FPDMA QUEUED
Error 161 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 58 ff ff ff 4f 00 05:19:37.989 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:37.989 READ FPDMA QUEUED
60 00 e8 ff ff ff 4f 00 05:19:37.988 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 05:19:37.988 READ FPDMA QUEUED
60 00 a8 ff ff ff 4f 00 05:19:37.973 READ FPDMA QUEUED
Error 160 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 10 ff ff ff 4f 00 05:19:35.017 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:35.017 READ FPDMA QUEUED
60 00 20 ff ff ff 4f 00 05:19:35.017 READ FPDMA QUEUED
60 00 e0 ff ff ff 4f 00 05:19:35.016 READ FPDMA QUEUED
60 00 a8 ff ff ff 4f 00 05:19:35.016 READ FPDMA QUEUED
Error 159 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 d8 ff ff ff 4f 00 05:19:32.018 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:32.017 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:32.017 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:32.016 READ FPDMA QUEUED
60 00 58 ff ff ff 4f 00 05:19:32.016 READ FPDMA QUEUED
Error 158 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 58 ff ff ff 4f 00 05:19:37.989 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:37.989 READ FPDMA QUEUED
60 00 e8 ff ff ff 4f 00 05:19:37.988 READ FPDMA QUEUED
60 00 08 ff ff ff 4f 00 05:19:37.988 READ FPDMA QUEUED
60 00 a8 ff ff ff 4f 00 05:19:37.973 READ FPDMA QUEUED
Error 160 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 10 ff ff ff 4f 00 05:19:35.017 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:35.017 READ FPDMA QUEUED
60 00 20 ff ff ff 4f 00 05:19:35.017 READ FPDMA QUEUED
60 00 e0 ff ff ff 4f 00 05:19:35.016 READ FPDMA QUEUED
60 00 a8 ff ff ff 4f 00 05:19:35.016 READ FPDMA QUEUED
Error 159 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 d8 ff ff ff 4f 00 05:19:32.018 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:32.017 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:32.017 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:32.016 READ FPDMA QUEUED
60 00 58 ff ff ff 4f 00 05:19:32.016 READ FPDMA QUEUED
Error 158 occurred at disk power-on lifetime: 8241 hours (343 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 58 ff ff ff 4f 00 05:19:29.026 READ FPDMA QUEUED
60 00 00 ff ff ff 4f 00 05:19:29.026 READ FPDMA QUEUED
60 00 d8 ff ff ff 4f 00 05:19:29.025 READ FPDMA QUEUED
60 00 38 ff ff ff 4f 00 05:19:28.988 READ FPDMA QUEUED
60 00 f0 ff ff ff 4f 00 05:19:28.988 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.