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 Post subject: WL750 smart tripped false positive
PostPosted: January 22nd, 2013, 1:40 
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Joined: January 22nd, 2013, 1:28
Posts: 3
Location: United States
this is the first time me being on this forum so bear with me a bit

I was wondering if there is any way to reset a smart false positive
the reason I say it is a false is because the drive says it has "reallocated sector count 0 sectors failing" :?
never had this kind of thing happen before

any idea's on what is causing this?

im including a screenshot just for kicks i was going to put this drive in a raid array but the array would keep rejecting this drive because of the smart failing


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File comment: screenshot of smart data
Screenshot from 2013-01-22 05_35_55.png
Screenshot from 2013-01-22 05_35_55.png [ 168.33 KiB | Viewed 4800 times ]
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 Post subject: Re: WL750 smart tripped false positive
PostPosted: January 22nd, 2013, 3:55 
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Joined: November 29th, 2006, 10:08
Posts: 7864
Location: UK
Why would you want to do that?

The smart failure is telling you that there is something wrong with the drive.

The smart isn't the actual problem, there is an underlying issue which will only manifest itself again, probably at the most inopportune moment!

Don't make yourself a "time bomb"!

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 Post subject: Re: WL750 smart tripped false positive
PostPosted: January 22nd, 2013, 11:31 
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Joined: May 6th, 2008, 22:53
Posts: 2138
Location: England
@james.85.jr,

james.85.jr wrote:
I was wondering if there is any way to reset a smart false positive

Unless you know exactly why that SMART attribute is reporting that way (hint: it is highly unlikely that you can know that!) then as pcimage says, any attempt to reset the SMART status (which can be done, but only with specialised software) could be creating a time-bomb for your data.

james.85.jr wrote:
the reason I say it is a false is because the drive says it has "reallocated sector count 0 sectors failing" :?

I suspect your analysis is incorrect, perhaps because unfortunately, that GUI is not displaying all of the data needed to perform a good-quality analysis. Also you left the green "highlight" line on SMART attribute #0 so some of the (currently missing) information about what the disk is reporting for attribute #5, is not being displayed by the GUI.

In short, IMHO get better details of the SMART data from the drive, before making any conclusions. To begin with, I suggest running "smartctl -x" from the smartmontools package (or if that command has problems on your system, start with the more mature (but slightly less useful on larger drives) "smartctl -a") and capture that output into a file. If you provide that output file (in full) from smartctl, then readers here can review the details and may be able to provide more insight.

Do you need the data on this drive? If so, do you already have a backup of that data elsewhere?


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 Post subject: Re: WL750 smart tripped false positive
PostPosted: January 22nd, 2013, 13:31 
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Joined: January 22nd, 2013, 1:28
Posts: 3
Location: United States
I ran smartctl but couldn't find the output file, so i just copied and pasted it all in gedit to save it but it wont let me upload it said extension not allowed i will see if i can copy and past it into the forum

sudo smartctl -a /dev/sdb
smartctl 5.43 2012-06-30 r3573 [i686-linux-3.5.0-17-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model: WL750GSA1672
Serial Number: WOL240141946
LU WWN Device Id: 5 0014ee 2ab82b5ac
Firmware Version: 02.01B01
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Tue Jan 22 17:18:03 2013 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.

General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (21000) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 241) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 201 180 021 Pre-fail Always - 4925
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 51
5 Reallocated_Sector_Ct 0x0033 001 001 140 Pre-fail Always FAILING_NOW 65521 (0 65535)
7 Seek_Error_Rate 0x000e 200 198 051 Old_age Always - 0
9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 3065
10 Spin_Retry_Count 0x0012 100 253 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 37
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1310
193 Load_Cycle_Count 0x0032 118 118 000 Old_age Always - 247948
194 Temperature_Celsius 0x0022 123 104 000 Old_age Always - 27
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

hope all this helps


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 Post subject: Re: WL750 smart tripped false positive
PostPosted: January 22nd, 2013, 14:04 
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Joined: May 6th, 2008, 22:53
Posts: 2138
Location: England
Thanks for the data. A little info seems to be missing (drive reports that 2 errors have been reported to the host, but none are listed at the end), however the main point is clear:

This data shows a consistent message from both the normalised and raw values of SMART attribute #5, that there is a "threshold exceeded" condition i.e. the drive is telling you that it has a problem. I see no indication of this being a "false positive", now that we have this data.

I can guess why the GUI was showing you a value of "0", but that's a GUI problem. As with many other situations where interpretation of SMART data is done, it is difficult to write software with the necessary flexibility and "knowledge" to correctly interpret all the various ways in which the raw data can be encoded (because recent versions of the ATA spec do not require that raw data to be provided by the drive in any specific way).

Based on that SMART data, personally I would not trust that drive, and it should be eligible for an RMA if it is within its warranty period.


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 Post subject: Re: WL750 smart tripped false positive
PostPosted: January 22nd, 2013, 19:34 
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Joined: January 22nd, 2013, 1:28
Posts: 3
Location: United States
thanks for the info I didn't know that guess I need to buy another hard drive.
To bad this drive is out of warranty iv'e already passed the 6 month return policy


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