December 27th, 2014, 14:59
December 27th, 2014, 16:11
December 27th, 2014, 17:34
December 27th, 2014, 18:03
December 27th, 2014, 21:08
December 28th, 2014, 8:25
pcimage wrote:Drive has bad sectors, firmware damage and/or physical heads issues. Or a combination of all 3.
Not realistically DIY'able.
December 28th, 2014, 15:59
December 28th, 2014, 16:09
December 28th, 2014, 23:46
root@partedmagic:~# smartctl -a /dev/sdc
smartctl 6.3 2014-07-26 r3976 [i686-linux-3.17.3-pmagic] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Elements / My Passport (USB, AF)
Device Model: WDC WD20NMVW-11AV3S0
Serial Number: WD-WXH1E33YYKU6
LU WWN Device Id: 5 0014ee 25e67fb87
Firmware Version: 01.01A01
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Dec 28 17:58:39 2014 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37620) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 415) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 198 194 051 Pre-fail Always - 1951
3 Spin_Up_Time 0x0027 232 207 021 Pre-fail Always - 3383
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1468
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 65535
9 Power_On_Hours 0x0032 090 090 000 Old_age Always - 7750
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 775
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 636
193 Load_Cycle_Count 0x0032 055 055 000 Old_age Always - 435480
194 Temperature_Celsius 0x0022 116 087 000 Old_age Always - 36
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 218
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 5365 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5365 occurred at disk power-on lifetime: 7749 hours (322 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:00:45.799 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:00:45.799 IDENTIFY DEVICE
ec 00 01 00 00 00 00 00 00:00:01.167 IDENTIFY DEVICE
Error 5364 occurred at disk power-on lifetime: 7749 hours (322 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:07:49.037 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:07:49.037 IDENTIFY DEVICE
b0 d0 00 00 4f c2 00 00 00:06:30.501 SMART READ DATA
e1 00 02 00 00 00 00 00 00:04:15.136 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:15.135 IDENTIFY DEVICE
Error 5363 occurred at disk power-on lifetime: 7749 hours (322 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:04:15.136 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:15.135 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:03:14.998 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:03:12.892 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:03:12.891 IDENTIFY DEVICE
Error 5362 occurred at disk power-on lifetime: 7749 hours (322 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 0f 00 00 00 00 00 00:03:14.998 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:03:12.892 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:03:12.891 IDENTIFY DEVICE
b0 da 00 00 4f c2 00 00 00:02:40.037 SMART RETURN STATUS
b0 d1 01 01 4f c2 00 00 00:02:40.028 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
Error 5361 occurred at disk power-on lifetime: 7749 hours (322 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:03:12.892 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:03:12.891 IDENTIFY DEVICE
b0 da 00 00 4f c2 00 00 00:02:40.037 SMART RETURN STATUS
b0 d1 01 01 4f c2 00 00 00:02:40.028 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 00 00 00:02:32.056 SMART READ DATA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Interrupted (host reset) 60% 7749 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
December 28th, 2014, 23:52
December 29th, 2014, 4:18
martinsjonass wrote:I see, but as I wrote earlier, I am here to learn.
As fzabkar said, it is possible to apply "slow fix" but it would require to convert to SATA. What SATA PCB would work instead of 2060-771961-001 REV A?
December 29th, 2014, 9:49
December 29th, 2014, 11:24
December 29th, 2014, 11:30
December 29th, 2014, 12:27
December 29th, 2014, 15:19
December 29th, 2014, 15:31
December 29th, 2014, 16:35
December 29th, 2014, 17:57
fzabkar wrote:My suggestion would be http://www.300dollardatarecovery.com. Their business model is a fixed price $300 data recovery using non-invasive methods. That is, they will do their best to recover your data without opening your drive, using the same hardware imaging tools and software that the more expensive shops use. Their fixed price business model means that they cannot and will not attempt to upsell you an expensive headswap.
December 29th, 2014, 18:02
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