HDD GURU FORUMS :: View topic - Hitachi HDP725050GLA360

smartctl 5.40 2010-03-16 r3077 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar P7K500 series
Device Model: Hitachi HDP725050GLA360
Serial Number: GEA534RJ02L77A
Firmware Version: GM4OA5CA
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sat Dec 25 23:19:52 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.

General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (7890) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 131) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 031 031 016 Pre-fail Always - 1526311368
2 Throughput_Performance 0x0005 096 096 054 Pre-fail Offline - 623
3 Spin_Up_Time 0x0007 115 115 024 Pre-fail Always - 333 (Average 334)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 153
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 101
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 129 129 020 Pre-fail Offline - 30
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 941
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 153
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 175
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 175
194 Temperature_Celsius 0x0002 176 176 000 Old_age Always - 34 (Lifetime Min/Max 17/50)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 101
197 Current_Pending_Sector 0x0022 005 005 000 Old_age Always - 1798
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 3852 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 3852 occurred at disk power-on lifetime: 941 hours (39 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 08 a3 e2 33 e0 00 00:09:12.200 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:09:07.200 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:09:02.200 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT

Error 3851 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 08 a3 e2 33 e0 00 00:09:07.200 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:09:02.200 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT

Error 3850 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 08 a3 e2 33 e0 00 00:09:02.200 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT
25 d5 20 29 82 1b e0 00 00:08:47.000 READ DMA EXT

Error 3849 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT
25 d5 20 29 82 1b e0 00 00:08:47.000 READ DMA EXT
25 d5 f0 39 81 1b e0 00 00:08:47.000 READ DMA EXT

Error 3848 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT
25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT
25 d5 20 29 82 1b e0 00 00:08:47.000 READ DMA EXT
25 d5 f0 39 81 1b e0 00 00:08:47.000 READ DMA EXT
25 d5 f0 49 80 1b e0 00 00:08:45.300 READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Author:	esa5jREaZEK [ February 3rd, 2011, 10:31 ]
Post subject:	Hitachi HDP725050GLA360
Hi, I have damaged hdd. I can access ntfs partition and i can see files on it. Im looking for solution to get information where (in what position) my files are physical on hdd. I need this because im using gddrescue for make a 1:1 copy. I would like use gddrescue to start only from position where my files are stored. Quote: `--input-position=pos' Starting position in input file, in bytes. Defaults to 0. In fill mode it refers to the original input file. What program show me that position after selecting a file? smart: Code: smartctl 5.40 2010-03-16 r3077 [i686-pc-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Hitachi Deskstar P7K500 series Device Model: Hitachi HDP725050GLA360 Serial Number: GEA534RJ02L77A Firmware Version: GM4OA5CA User Capacity: 500,107,862,016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 4 Local Time is: Sat Dec 25 23:19:52 2010 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. See vendor-specific Attribute list for failed Attributes. General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (7890) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 131) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 031 031 016 Pre-fail Always - 1526311368 2 Throughput_Performance 0x0005 096 096 054 Pre-fail Offline - 623 3 Spin_Up_Time 0x0007 115 115 024 Pre-fail Always - 333 (Average 334) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 153 5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 101 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 129 129 020 Pre-fail Offline - 30 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 941 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 153 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 175 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 175 194 Temperature_Celsius 0x0002 176 176 000 Old_age Always - 34 (Lifetime Min/Max 17/50) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 101 197 Current_Pending_Sector 0x0022 005 005 000 Old_age Always - 1798 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 3852 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 3852 occurred at disk power-on lifetime: 941 hours (39 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d5 08 a3 e2 33 e0 00 00:09:12.200 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:09:07.200 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:09:02.200 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT Error 3851 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d5 08 a3 e2 33 e0 00 00:09:07.200 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:09:02.200 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT Error 3850 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d5 08 a3 e2 33 e0 00 00:09:02.200 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT 25 d5 20 29 82 1b e0 00 00:08:47.000 READ DMA EXT Error 3849 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d5 08 a3 e2 33 e0 00 00:08:57.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT 25 d5 20 29 82 1b e0 00 00:08:47.000 READ DMA EXT 25 d5 f0 39 81 1b e0 00 00:08:47.000 READ DMA EXT Error 3848 occurred at disk power-on lifetime: 940 hours (39 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 a3 e2 33 ea Error: UNC 8 sectors at LBA = 0x0a33e2a3 = 171172515 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d5 08 a3 e2 33 e0 00 00:08:52.100 READ DMA EXT 25 d5 08 a3 e2 33 e0 00 00:08:47.000 READ DMA EXT 25 d5 20 29 82 1b e0 00 00:08:47.000 READ DMA EXT 25 d5 f0 39 81 1b e0 00 00:08:47.000 READ DMA EXT 25 d5 f0 49 80 1b e0 00 00:08:45.300 READ DMA EXT SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Thank you very much for answer, Regards.

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